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XEDITION

Thin Film Thickness Measurement

Optics Properties & Measurements

Spectral Products have been providing our monochromators and spectrometers for various reflectometric and ellipsometric systems. By using those systems, the thin film thickness, the index of the refraction and other optical properties of the optical thin film coatings can be measured.

 

Spectrometers are being used in the manufacturing of semiconductor and display devices, optical monitoring system of optical coatings, and surface plasma resonance (SPR) systems. Wide range of selections for our spectrometers and monochromators makes it possible to build spectroscopic ellipsometer systems efficiently. Spectral Products' OEM modules are being used in many semiconductor inspection and optical coating monitoring systems successfully.

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